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Simple Method to Test a Field Effect Transistor for Defects

Published 01.01.2012 Presenter Valerij Kharybin

A Simple Method to Test a Field Effect Transistor for Defects
Modern electronics use more and more FET's. The reliability of their design has been proved by practice. This is why they are highly usable and effective in various types of household appliances.
However, sometimes we have to repair them. In this case we often need to test a component for defects ...