ADRF5026-EVALZ-240, RF Development Tools Eval Board

ADRF502x Evaluation Boards
Analog Devices Inc. ADRF502x Evaluation Boards are designed as fully populated, 4-layer, RO4003 based evaluation boards for the ADRF502x Silicon SPDT Switches. These evaluation boards from Analog Devices feature 4-layer construction with a copper thickness of 0.5oz (0.7mil) and dielectric materials between each copper layer. The board routes all RF and DC traces to the top copper layer. The inner and bottom layers are grounded planes that provide a solid ground for the RF transmission lines. Constructed using 8-mil Rogers RO4003 material, the top dielectric offers good high-frequency performance. The middle and bottom layers use FR-4 type materials to achieve an overall board thickness of 62mil.